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JJG 629-1989
JJG 629-1989 Polycrystalline X-ray Diffractometer
Abstract
This procedure is applicable to the verification of newly manufactured, in-use, and repaired polycrystalline X-ray diffractometers (hereinafter referred to as "instruments").
General Product Information
| Committee | Shanghai Municipal Technical Supervision Bureau |
|---|---|
| Document Type | National Metrology and Inspection Regulations JJG |
| Publisher Name | The National Technical Supervision Bureau |
| Standard Status | Replaced |
| Standard Code | JJG 629-1989 |
| Implement Date | 1990-06-15 |
Price
$ 42
Subtotal
$ 42
Tax
$ 0.00
Order Total (incl. tax)
$ 42