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GB/T 14146-1993
GB/T 14146-1993 Silicon epitaxial layers—Determination of carrier concentration—Mercury probe Valtage-capacitance method
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 14146-1993 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | Non-ferrous metals |
| Implement Date | 1993-10-01 |
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