GB/T 24582-2023 Active
GB/T 24582-2023 Test method for measuring surface metal impurity content of polycrystalline silicon—Acid extraction-inductively coupled plasma mass spectrometry method
Abstract
This document describes a method for extracting metal impurities from the surface of polycrystalline silicon using acid, and quantitatively detecting the content of metal impurities on the surface of polycrystalline silicon using an inductively coupled plasma mass spectrometer. This document is suitable for determining the content of alkali metals, alkaline earth metals, and first-row transition elements such as sodium, potassium, calcium, iron, nickel, copper, zinc, and aluminum on the surface of solar-grade and electronic-grade polycrystalline silicon, with a detection range of 0.01 ng/g.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 24582-2023 |
| CCS | Analysis methods for semi-metallic and semiconductor materials |
| ICS | \nMetal material testing |
| Implement Date | 2024-03-01 |