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GB/T 4937.12-2018 Active
GB/T 4937.12-2018 Semiconductor devices—Mechanical and climatic test methods—Part 12:Vibration,variable frequency
Abstract
The purpose of this part of GB/T 4937 is to determine the impact of vibration on devices within a specified frequency range. This test is a destructive test, typically used for devices with cavities. This test is largely consistent with GB/T 2423.10-2008, but given the special requirements of semiconductor devices, the provisions of this part are adopted instead.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.12-2018 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2019-01-01 |
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