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QJ 10005-2008 Active
QJ 10005-2008 Test guidelines of single event effects induced by heavy ions of semiconductor devices for space applications
General Product Information
| Document Type | Industry standards-Aerospace |
|---|---|
| Standard Status | Active |
| Standard Code | QJ 10005-2008 |
| CCS | Electronic components |
| ICS | Components used in aerospace manufacturing |
| Implement Date | 2008-06-01 |
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