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GB/T 4937.13-2018 Active
GB/T 4937.13-2018 Semiconductor devices—Mechanical and climatic test methods—Part 13:Salt atmosphere
Abstract
This part of GB/T 4937 specifies the salt spray test method for semiconductor devices to determine their corrosion resistance. This test is an accelerated test simulating the effects of harsh coastal atmospheres on the exposed surfaces of devices. It is suitable for devices operating at sea and in coastal areas.
This test is a destructive test.
This test generally complies with IEC 60068-2-11, but given the special requirements of semiconductor devices, the provisions of this part are adopted.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.13-2018 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2019-01-01 |
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