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GB/T 27788-2011

GB/T 27788-2011 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

Available format(s)
PDF
Language(s)
Chinese
Publish Date
2011-12-30

Abstract

This standard specifies a method for calibrating the magnification of scanning electron microscope (SEM) images using appropriate reference materials.
This standard is limited to calibrating the magnification determined by the range of line spacing on the reference material.
This standard is not applicable to dedicated length-measurement scanning electron microscopes.

General Product Information

Document Type National standards
Standard Status Replaced
Standard Code GB/T 27788-2011
CCS A magnifying glass and a microscope
ICS Optical equipment
Implement Date 2012-08-01
Price $ 57
Subtotal $ 57
Tax $ 0.00
Order Total (incl. tax) $ 57

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