GB/T 5594.4-2015 Active
GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value
Abstract
This part of GB/T 5594 specifies the test methods for the dielectric constant and dielectric loss angle tangent values of electronic ceramic materials used in device parts, vacuum electronic devices, resistor substrates, semiconductors, and integrated circuit substrates. This part is applicable to the testing of the dielectric constant and dielectric loss angle tangent values of electronic ceramic materials used in device parts, vacuum electronic devices, resistor substrates, semiconductors, and integrated circuit substrates at a frequency of 1 MHz and temperatures ranging from room temperature to 500°C.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 5594.4-2015 |
| CCS | Electronic devices and specialized materials, parts, and structural components |
| ICS | Special materials for electronic technology |
| Implement Date | 2016-01-01 |