T/CSTM 01003-2023 Active
T/CSTM 01003-2023 Electrical Performance Test Method for Phase-Change Memory Devices
Abstract
Scope: This document specifies the electrical performance test methods for phase-change memory cell devices, which are divided into device performance testing and device reliability testing. Device performance testing includes current-voltage characteristics, storage window, set-up time, set-up voltage, reset time, reset voltage, and power consumption; device reliability testing includes durability and data retention time. This document is applicable to phase-change memory cell devices (hereinafter referred to as "devices"). Main technical content: This document specifies the electrical performance test methods for phase-change memory cell devices, which are divided into device performance testing and device reliability testing. Device performance testing includes current-voltage characteristics, storage window, set-up time, set-up voltage, reset time, reset voltage, and power consumption; device reliability testing includes durability and data retention time. This document is applicable to phase-change memory cell devices (hereinafter referred to as "devices").
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CSTM 01003-2023 |
| CCS | Electronic components and information technology |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2023-06-07 |