T/CSTM 00986-2023 Active
T/CSTM 00986-2023 Frequency-dependent measurement of the dielectric constant of high-frequency substrate using the balanced disk resonator method
Abstract
Scope: This document specifies a balanced disk test method for the dielectric constant and dielectric loss tangent of medium substrates in the microwave and millimeter wave frequency bands, including principles, environmental conditions, instrumentation, sample requirements, test steps, precautions, and test reports. This document is applicable to testing the dielectric constant and dielectric loss tangent of sheet materials in the microwave and millimeter wave frequency bands, with the electric field perpendicular to the surface of the plate. Frequency test range: f = 5 GHz ~ 170 GHz; Dielectric constant test range: ε_r = 2.0 ~ 10.0; Loss tangent value test range: tanδ = 1.0×10(-4) ~ 1.0×10(-2); Main technical content: This document specifies a balanced disk test method for the dielectric constant and dielectric loss tangent of medium substrates in the microwave and millimeter wave frequency bands, including principles, environmental conditions, instrumentation, sample requirements, test steps, precautions, and test reports. This document is applicable to testing the dielectric constant and dielectric loss tangent of sheet materials in the microwave and millimeter wave frequency bands, with the electric field perpendicular to the surface of the plate. Frequency test range: f = 5 GHz ~ 170 GHz; Dielectric constant test range: ε_r = 2.0 ~ 10.0; Loss tangent value test range: tanδ = 1.0×10(-4) ~ 1.0×10(-2)
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CSTM 00986-2023 |
| CCS | Electronic components and information technology |
| ICS | Printed circuits and printed circuit boards |
| Implement Date | 2023-07-07 |