T/CSTM 01011-2023 Active

Scope: This document specifies the measurement method of the real part of the relative dielectric constant and the tangent of the dielectric loss angle of solid dielectrics, composite boards, engineering plastics, and other materials in the range of 20 GHz to 110 GHz using the open confocal resonant cavity method. Among them, the measurement range of the real part of the relative dielectric constant is 2 to 30, and the measurement range of the tangent of the dielectric loss angle is 0.0001 to 0.05. This document is applicable to the real part of the relative dielectric constant and the tangent of the dielectric loss angle of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, boron nitride, silicon carbide, and barium titanate, as well as organic-inorganic composite boards such as printed circuit boards, and organic engineering plastics such as polytetrafluoroethylene and polystyrene. It is also suitable for the real part of the relative dielectric constant and the tangent of the dielectric loss angle of other similar solid dielectrics, composite boards, engineering plastics, and their film samples such as liquid crystal polymers and modified polyimides. Main technical content: This document specifies the measurement method of the real part of the relative dielectric constant and the tangent of the dielectric loss angle of solid dielectrics, composite boards, engineering plastics, and other materials in the range of 20 GHz to 110 GHz using the open confocal resonant cavity method. Among them, the measurement range of the real part of the relative dielectric constant is 2 to 30, and the measurement range of the tangent of the dielectric loss angle is 0.0001 to 0.05. This document is applicable to the real part of the relative dielectric constant and the tangent of the dielectric loss angle of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, boron nitride, silicon carbide, and bar