GB/T 43889-2024 Active

This document provides guidelines for conducting routine diagnostics and implementing quality assurance procedures for electron probe microanalysis (EPMA) instruments. Instrument operators regularly use this procedure to confirm that the instrument is in good working order or to troubleshoot any issues. It covers the characteristics of the reference materials required and the analytical procedures necessary for independently testing and comprehensively evaluating the performance of the main components of the EPMA system. The analytical procedures described in this document are designed to verify the instrument's ability to perform exploratory analyses, trace element analyses, and unconventional tasks (such as peak interference) on unknown samples, distinct from the single-element rapid diagnostic procedures used solely for diffracted crystal positions and test condition checks. This document is applicable to electron probe and other wave spectrometer (WDS) systems, which use the characteristic X-ray spectra detected by the WDS to perform element identification and quantitative analysis through wavelength and intensity analysis. It is not applicable to elemental analysis conducted by energy dispersive spectrometers (EDS).