YS/T 14-1991 Abolished Industry standards-Non-ferrous metals

YS/T 14-1991 The method for measuring the thickness of the dopant-enriched epitaxial layer and the silicon eutectic layer

Publish Date: 1991-04-26 Implement Date: 1992-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 14-1991

Standard Type: Industry standards

Standard Status: Abolished

is_force_gb: no

CCS Name: -

ICS Name: -

Publish Date: 1991-04-26

Implement Date: 1992-06-01

Development Information

Superseded by the following standards

YS/T 14-2015 Test method for thickness of heteroepitaxy layers and polycrystalline layers

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