YS/T 1600-2023 Active Industry standards-Non-ferrous metals

YS/T 1600-2023 Determination of Trace Impurity Element Content in Silicon Carbide Single Crystals Using Plasma-Based Mass Spectrometry

Publish Date: 2023-04-21 Implement Date: 2023-11-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: YS/T 1600-2023

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Analysis methods for semi-metallic and semiconductor materials

ICS Name: Chemical analysis of metal materials

Publish Date: 2023-04-21

Implement Date: 2023-11-01

Scope

This document is applicable to the determination of the impurity element content in silicon carbide single crystals.

Development Information

Related Standards

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