T/CSTM 00750-2022 Active Group standards

T/CSTM 00750-2022 Millimeter wave frequency band material dielectric performance testing using open-ended hemispherical resonant cavity method

Publish Date: 2022-04-19 Implement Date: 2022-07-19 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/CSTM 00750-2022

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic components and information technology

ICS Name: Electronic components comprehensive

Publish Date: 2022-04-19

Implement Date: 2022-07-19

Pages: 15 pages

Scope

Scope: This document specifies the measurement method for the real part of the relative permittivity and the tangent of the loss angle of inorganic materials, composite boards, engineering plastics, and other materials with a frequency range of 20GHz to 60GHz using the open hemisphere resonant cavity method. Among them, the measurement range of the real part of the relative permittivity is 2 to 30, and the measurement range of the tangent of the loss angle is 0.05 to 0.0001. This document is applicable to the measurement of the real part of the relative permittivity and the tangent of the loss angle of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, and boron nitride; organic/inorganic composite boards such as polytetrafluoroethylene filled with titanium dioxide; and organic engineering plastics such as polyetheretherketone and polystyrene. It is also applicable to the measurement of the real part of the relative permittivity and the tangent of the loss angle of other similar solid dielectrics, composite boards, engineering plastics, and their films. Main technical content: This document specifies the measurement method for the real part of the relative permittivity and the tangent of the loss angle of inorganic materials, composite boards, engineering plastics, and other materials with a frequency range of 20GHz to 60GHz using the open hemisphere resonant cavity method. Among them, the measurement range of the real part of the relative permittivity is 2 to 30, and the measurement range of the tangent of the loss angle is 0.05 to 0.0001. This document is applicable to the measurement of the real part of the relative permittivity and the tangent of the loss angle of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, and boron nitride; organic/inorganic composite boards such as polytetrafluoroethylene filled with titanium dioxide; and organic engineering plastics such as polyeth