T/CSTM 00909-2023 Dielectric constant and loss angle tangent testing method for medium substrate (1MHz-1GHz) using parallel plate capacitance method
T/CSTM 00909-2023 Dielectric constant and loss angle tangent testing method for medium substrate (1MHz-1GHz) using parallel plate capacitance method
Basic Information
Scope
Scope: This document specifies the symbols and abbreviations, principles, environmental conditions, instrumentation, samples, test procedures, calculations, system errors, precautions, and sample reports for testing the dielectric constant and dielectric loss tangent of dielectric substrates using the contact electrode parallel plate capacitance method. This document is applicable to the dielectric constant and dielectric loss tangent testing methods of dielectric substrates and similar dielectric materials, but not to the measurement of low-loss materials. Frequency test range: f = 1 MHz to 1 GHz; Dielectric constant test range: ε_r' = 1.0 to 35.0; Loss tangent value test range: tan? δ_ε = 5.0 × 10(-3) to 5.0 × 10(-2); Main technical content: This document specifies the symbols and abbreviations, principles, environmental conditions, instrumentation, samples, test procedures, calculations, system errors, precautions, and sample reports for testing the dielectric constant and dielectric loss tangent of dielectric substrates using the contact electrode parallel plate capacitance method. This document is applicable to the dielectric constant and dielectric loss tangent testing methods of dielectric substrates and similar dielectric materials, but not to the measurement of low-loss materials. Frequency test range: f = 1 MHz to 1 GHz; Dielectric constant test range: ε_r' = 1.0 to 35.0; Loss tangent value test range: tan? δ_ε = 5.0 × 10(-3) to 5.0 × 10(-2).