GB/T 4855-1984
Abolished
T/CIE 134-2022
Active
Group standards
T/CIE 134-2022 Magnetic random access memory (MRAM) chip data retention time testing method
T/CIE 134-2022 Magnetic random access memory (MRAM) chip data retention time testing method
Price:
$ 20.00
Basic Information
Standard Code:
T/CIE 134-2022
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2022-08-10
Implement Date:
2022-08-10
Pages:
12 pages
Scope
This document specifies the testing principles, testing environment, testing equipment, and testing procedures for the data retention time test of magnetic random access memory chips. This document is applicable to the data retention time test of magnetic random access memory chips and the verification of the data retention time of magnetic random access memory chips.
Development Information
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished