T/CPIA 0051-2023 Active Group standards

T/CPIA 0051-2023 Metal electrode contact resistance of crystalline silicon photovoltaic cells test method using transmission line model (TLM) method

T/CPIA 0051-2023 Metal electrode contact resistance of crystalline silicon photovoltaic cells test method using transmission line model (TLM) method

Publish Date: 1970-01-01 Implement Date: 1970-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/CPIA 0051-2023
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: -
ICS Name: -
Publish Date: 1970-01-01
Implement Date: 1970-01-01

Scope

This document specifies the test method for measuring the contact resistance of the metal electrodes of crystalline silicon photovoltaic cells using the transmission line model (TLM) method, including the method principle, requirements, sample preparation, test steps, data processing, and reporting. This document is applicable to the measurement of the contact resistance of the metal electrodes of crystalline silicon photovoltaic cells in a darkroom environment.

Development Information

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