GB/T 1957-1981
Replaced
GB/T 24468-2009
Replaced
National standards
GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability,availability and maintainability(RAM)
GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability,availability and maintainability(RAM)
Basic Information
Standard Code:
GB/T 24468-2009
Standard Type:
National standards
Standard Status:
Replaced
is_force_gb:
no
CCS Name:
Electronic measurement and instruments
ICS Name:
Measuring instruments and meters
Publish Date:
2009-10-15
Implement Date:
2009-12-01
Pages:
36 pages
Scope
2.1 This standard defines six basic states of equipment, and all equipment conditions and stages must fall into these six states. The state of the equipment is determined by its function, regardless of who performs this function. The measurement of equipment reliability involved in this specification primarily focuses on the relationship between equipment failure and equipment usage, rather than the relationship between equipment failure and the total (calendar) time the equipment has experienced.
Development Information
Superseded by the following standards
Referenced Standards
SEMI E35
SEMI E58
SEMI E79
SEMI E116
Adopt standards
SEMI E10-0304
Related Standards
GB/T 1216-1985
Replaced
GB/T 1216-1985 Micrometers
GB/T 5106-1985
Replaced
GB/T 5106-1985 Gauges for straight cylindrical involute splines
GB/T 6091-1985
Replaced
GB/T 6091-1985 Straight edge
GB/T 1217-1986
Replaced
GB/T 1217-1986 Gear tooth micrometers
GB/T 13925-1992
Replaced