GB/T 24468-2009 Replaced National standards

GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability,availability and maintainability(RAM)

GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability,availability and maintainability(RAM)

Publish Date: 2009-10-15 Implement Date: 2009-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 24468-2009
Standard Type: National standards
Standard Status: Replaced
is_force_gb: no
CCS Name: Electronic measurement and instruments
ICS Name: Measuring instruments and meters
Publish Date: 2009-10-15
Implement Date: 2009-12-01
Pages: 36 pages

Scope

2.1 This standard defines six basic states of equipment, and all equipment conditions and stages must fall into these six states. The state of the equipment is determined by its function, regardless of who performs this function. The measurement of equipment reliability involved in this specification primarily focuses on the relationship between equipment failure and equipment usage, rather than the relationship between equipment failure and the total (calendar) time the equipment has experienced.

Development Information

Word Count: 58 Thousand words Pages: 36 pages

Superseded by the following standards

Referenced Standards

SEMI E35 SEMI E58 SEMI E79 SEMI E116

Adopt standards

SEMI E10-0304

Related Standards

Contact Us