GB/T 44181-2024 Space environment—Method of single event upset rates prediction of semiconduct-or devices for space applications

Scope

This document describes the method for estimating the on-orbit single-particle flip-flop rate of aerospace semiconductor devices (hereinafter referred to as "devices"), including the principles, process, calculation of the LET spectrum and proton energy spectrum of space charged particles, analysis of irradiation test data, and estimation of the single-particle flip-flop rate. This document is applicable to the estimation of the single-particle flip-flop rate of devices induced by protons and heavy ions in the natural space radiation environment. For other types of single-particle events such as single-particle functional interruption, reference should be made to the estimation of their event rates. This document is not applicable to the estimation of the single-particle flip-flop rate induced by high-energy electrons.

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