T/CITS 0101-2024 Quantitative Acceleration Test Method for Electrical Control System of Scientific Instruments and Equipment

Scope

Scope: This document is applicable to the rapid verification and evaluation of reliability and lifespan indicators for electronic control systems and electronic components, circuit board assemblies of scientific instruments and equipment. Main technical content: Based on the characteristics and application environments of electronic control systems for scientific instruments and equipment, the average time between failures and lifespan/service life indicators are evaluated using quantitative accelerated testing methods. The selection and calculation methods for accelerated test stress, accelerated models, and their factors, as well as a detailed quantitative accelerated testing process are provided, enabling rapid evaluation of the reliability or lifespan/service life of electronic control systems for scientific instruments and equipment. The main technical content includes the following: 1. General requirements - requirements for test samples, test equipment/instruments, test conditions and tolerances, accelerated models and their factors, requirements for test preparation, fault determination and consequence classification, and statistical principles for validating the effectiveness of the test. 2. Test methods - test classification, determination and calculation of test stress and accelerated factors, accelerated test process and steps. 3. Appendix content - provides examples of accelerated testing design for reliability indicators and lifespan indicators, stress magnitude setting, accelerated test modeling and accelerated factor calculation, as well as a complete set of accelerated test record forms.

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