GB/T 4855-1984
Abolished
GB/T 36474-2018
Active
National standards
GB/T 36474-2018 Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
GB/T 36474-2018 Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
Basic Information
Standard Code:
GB/T 36474-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-06-07
Implement Date:
2019-01-01
Pages:
15 pages
Scope
This standard specifies the methods for functional verification and electrical parameter testing of the third-generation double data rate synchronous dynamic random access memory (DDR3 SDRAM) in semiconductor integrated circuits.
This standard is applicable to the functional verification and electrical parameter testing of the third-generation double data rate synchronous dynamic random access memory (DDR3 SDRAM) in the field of semiconductor integrated circuits.
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished