GB/T 44635-2024 Electrostatic discharge sensitivity testing—Transmission line pulse(TLP)—Component level
GB/T 44635-2024 Electrostatic discharge sensitivity testing—Transmission line pulse(TLP)—Component level
Basic Information
Scope
This document defines a transmission line pulse (TLP) test method for evaluating the voltage and current response of the semiconductor device under test and assessing the design parameters of the electrostatic discharge (ESD) human body model (HBM) protection. This document establishes a method for conducting TLP-related tests and reporting information. The scope and focus of this document involve TLP test techniques for semiconductor devices. This document is not an alternative method to HBM test standards (e.g., IEC 60749-26). The purpose of this document is to establish guidelines for TLP methods in order to extract HBM ESD parameters of semiconductor devices. This document provides standard measurements and procedures for correctly extracting HBM ESD parameters using TLP.