GB/T 44635-2024 Active National standards

GB/T 44635-2024 Electrostatic discharge sensitivity testing—Transmission line pulse(TLP)—Component level

GB/T 44635-2024 Electrostatic discharge sensitivity testing—Transmission line pulse(TLP)—Component level

Publish Date: 2024-09-29 Implement Date: 2024-09-29 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: GB/T 44635-2024
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor integrated circuits
ICS Name: Semiconductor discrete devices
Publish Date: 2024-09-29
Implement Date: 2024-09-29
Pages: 24 pages

Scope

This document defines a transmission line pulse (TLP) test method for evaluating the voltage and current response of the semiconductor device under test and assessing the design parameters of the electrostatic discharge (ESD) human body model (HBM) protection. This document establishes a method for conducting TLP-related tests and reporting information. The scope and focus of this document involve TLP test techniques for semiconductor devices. This document is not an alternative method to HBM test standards (e.g., IEC 60749-26). The purpose of this document is to establish guidelines for TLP methods in order to extract HBM ESD parameters of semiconductor devices. This document provides standard measurements and procedures for correctly extracting HBM ESD parameters using TLP.

Development Information

Word Count: 34 Thousand words Pages: 24 pages

Adopt standards

IEC 62615:2010

Related Standards

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