T/TAIA 001-2024 The determination of the content of potassium oxide and sodium oxide in industrial potassium silicate, using inductively coupled plasma atomic emission spectroscopy
T/TAIA 001-2024 The determination of the content of potassium oxide and sodium oxide in industrial potassium silicate, using inductively coupled plasma atomic emission spectroscopy
Basic Information
Scope
Scope: This document specifies the method for determining the content of potassium oxide and sodium oxide in industrial potassium sodium silicate by inductively coupled plasma emission spectrometry. This document is applicable to the determination of potassium oxide and sodium oxide in industrial potassium sodium silicate. The determination range is: potassium oxide 1.00% to 25.0%, sodium oxide 1.00% to 15.0%; Main technical content: The main technical principle of this document is: the sample is dissolved with hydrochloric acid, nitric acid, and hydrofluoric acid, and then digested with perchloric acid. Yttrium is added as an internal standard, and the solution is diluted to a certain volume. The content of potassium oxide and sodium oxide is determined by inductively coupled plasma atomic emission spectrometer, and the emission intensity of yttrium at 371.03 nm is measured simultaneously, and the content of each element is calculated.