GB/T 4855-1984
Abolished
GB/T 17574.10-2003
Active
National standards
GB/T 17574.10-2003 Semiconductor devices-Integrated circuits—Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
GB/T 17574.10-2003 Semiconductor devices-Integrated circuits—Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
Basic Information
Standard Code:
GB/T 17574.10-2003
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2003-11-24
Implement Date:
2004-08-01
Pages:
20 pages
Development Information
Referenced Standards
GB/T 4728.12-1996 Graphical symbols for electrical diagrams—Part 12:Binary logic elements
GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
GB/T 17574-1998 Semiconductor devices Integrated circuits Part 2:Digital integrated circuits
IEC 60069-2-17:1978
IEC 60134:1961
IEC 60747-10:1991/QC700000
IEC 0748-11:1990/QC790100
Adopt standards
IEC 60748-2-10:1994
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished