DB52/T 1104-2016 Abolished Guizhou ProvinceLocal standards

DB52/T 1104-2016 Semiconductor device junction-cage thermal resistance transient testing method

Publish Date: 2016-04-01 Implement Date: 2016-10-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: DB52/T 1104-2016

Standard Type: Local standards

Standard Status: Abolished

is_force_gb: no

CCS Name: Semiconductor discrete devices

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2016-04-01

Implement Date: 2016-10-01

Development Information

Related Standards

GB/T 14264-1993 Replaced

GB/T 14264-1993 Semiconductor materials—Terms and definitions

Publish Date: 1993-03-12

GB/T 14844-1993 Replaced

GB/T 14844-1993 Designations of semiconductor materials

Publish Date: 1993-12-24

GB/T 17573-1998 Active

GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General

Publish Date: 1998-11-17

GB/T 12560-1999 Active

GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices

Publish Date: 1999-08-02

GB/T 11499-2001 Active

GB/T 11499-2001 Letter symbols for discrete semiconductor devices

Publish Date: 2001-11-05

GB/T 20521-2006 Active

GB/T 20521-2006 Semiconductor devices—Part 14-1:Semiconductor sensors—General and classification

Publish Date: 2006-08-23