GB/T 14264-1993
Replaced
SJ/T 11845.2-2022
Active
Industry standards-Electronics
SJ/T 11845.2-2022 Electronic Component Reliability Evaluation Method Based on Low-frequency Noise Parameters - Part 2: Optoelectronic Coupling Devices
SJ/T 11845.2-2022 Electronic Component Reliability Evaluation Method Based on Low-frequency Noise Parameters - Part 2: Optoelectronic Coupling Devices
Price:
$ 30
Basic Information
Standard Code:
SJ/T 11845.2-2022
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Optoelectronic devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2022-10-20
Implement Date:
2023-01-01
Development Information
Same series standard
SJ/T 11845.1-2022 Method for evaluating the reliability of electronic components based on low-frequency noise parameters - Part 1: General requirements
SJ/T 11845.3-2022 Low-frequency noise parameter-based reliability evaluation method for electronic components Part 3: Diodes. (English translation only)
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active