DB32/T 3594-2019 Active Jiangsu ProvinceLocal standards

DB32/T 3594-2019 Test method for hot-spot endurability of crystalline silicon solar cells

DB32/T 3594-2019 Test method for hot-spot endurability of crystalline silicon solar cells

Publish Date: 2019-04-08 Implement Date: 2019-04-30 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: DB32/T 3594-2019
Standard Type: Local standards
Standard Status: Active
is_force_gb: no
CCS Name: Solar energy
ICS Name: Solar energy engineering
Publish Date: 2019-04-08
Implement Date: 2019-04-30
Pages: 12 pages

Scope

This standard specifies the test principles, instrumentation, test procedures, and test results for the durability of hot spots in crystalline silicon solar cells. This standard is applicable to monocrystalline and polycrystalline silicon solar cells, and can also be used for samples that have been encapsulated, but the circuit of the battery is separately extracted.

Development Information

Word Count: 12 Thousand words Pages: 12 pages

Referenced Standards

IEC 60904-1 IEC 60904-9 IEC 61215-2 UL 1703

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