GB/T 6256-1986
Active
SJ/T 11765-2020
Active
Industry standards-Electronics
SJ/T 11765-2020 Transistor low-frequency noise parameter testing method
SJ/T 11765-2020 Transistor low-frequency noise parameter testing method
Price:
$ 30
Basic Information
Standard Code:
SJ/T 11765-2020
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor transistor
ICS Name:
Diode
Publish Date:
2020-12-09
Implement Date:
2021-04-01
Scope
It is suitable for bipolar transistors and field-effect transistors. Other transistor products can be implemented according to this standard
Development Information
Related Standards
GB/T 12300-1990
Active
GB/T 12300-1990 Test methods of safe operating area for power transistors
GB/T 16468-1996
Active
GB/T 16468-1996 Series programmes for static induction transistors
GB/T 6218-1996
Active
GB/T 6218-1996 Blank detail specification for bipolar transistors for switching applications
GB/T 7577-1996
Active
GB/T 7577-1996 Blank detail specification for case-rated bipolar transistors for low-frequency amplification
GB/T 17007-1997
Abolished