T/BDT 003-2024 High-speed analog-to-digital converter (ADC) test equipment
T/BDT 003-2024 High-speed analog-to-digital converter (ADC) test equipment
Basic Information
Scope
Scope: This document specifies the product classification, requirements, test methods, inspection rules, marking, packaging, transportation, and storage of high-speed analog-to-digital converter (ADC) test equipment. This document is applicable to the design, manufacture, and inspection of high-speed analog-to-digital converter (ADC) test equipment; Main technical content: It simultaneously supports digital interfaces such as LVDS and 204B, supports protocols such as SPI and I2C, and supports fully automatic ADC chip test machines with a sampling rate of no more than 12.5 Gbps. Its SNR and SINAD indicators can meet the testing needs of the vast majority of chips on the market. By using self-developed INL and DNL algorithms, it enables higher efficiency and lower thresholds in testing. For high-precision ADC chips, it also has significant advantages in the stability of dynamic performance testing.