SJ/T 2749-2016 Active Industry standards-Electronics

SJ/T 2749-2016 SJ/T 2749-2016 Semiconductor laser diode test method

Publish Date: 2016-01-15 Implement Date: 2016-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: SJ/T 2749-2016

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor light-emitting devices

ICS Name: Semiconductor discrete devices

Publish Date: 2016-01-15

Implement Date: 2016-06-01

Pages: 34 pages

Development Information

Pages: 34 pages

Replace the following standards

SJ 2749-1987 Method of measurement for semiconductor laser diodes

Related Standards

GB/T 7581-1987 Active

GB/T 7581-1987 Dimensions of outlines for semiconductor discrete devices

Publish Date: 1987-03-21

GB/T 4586-1994 Active

GB/T 4586-1994 Semiconductor devices Discrete devices—Part 8:Field-effect transistors

Publish Date: 1994-12-30

GB/T 4587-1994 Replaced

GB/T 4587-1994 Semiconductor discrete devices and integrated circuits—Part 7:Bipolar transistors

Publish Date: 1994-12-30

GB/T 4937-1995 Replaced

GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices

Publish Date: 1995-12-22

GB/T 9313-1995 Active

GB/T 9313-1995 General specifications for CRT display device of computer

Publish Date: 1995-12-22

GB/T 8446.1-2004 Replaced

GB/T 8446.1-2004 Heat sink for power semiconductor device—Part 1:Casting kind series

Publish Date: 2004-02-04