SJ/T 3328.1-2016 Active Industry standards-Electronics

SJ/T 3328.1-2016 Electronic products - High purity silica sand - Part 1: Technical specifications

Publish Date: 2016-01-15 Implement Date: 2016-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: SJ/T 3328.1-2016

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic devices and specialized materials, parts, and structural components

ICS Name: Special materials for electronic technology

Publish Date: 2016-01-15

Implement Date: 2016-06-01

Development Information

Same series standard

SJ/T 3328.2-2016 Electronic Products - High Purity Quartz Sand - Part 2: General Analytical Methods SJ/T 3328.3-2016 SJ/T 3328.3-2016 Electronic Products High Purity Quartz Sand Part 3: Determination of Loss on Ignition SJ/T 3328.4-2016 Electronic Products - High Purity Quartz Sand - Part 4: Determination of Silicon Dioxide SJ/T 3328.5-2016 Electronic Products - High Purity Quartz Sand - Part 5: Determination of Iron SJ/T 3328.6-2016 SJ/T 3328.6-2016 Electronic Products High Purity Quartz Sand Part 6: Determination of Copper SJ/T 3328.7-2016 High-Purity Quartz Sand for Electronic Products - Part 7: Determination of Chromium Content SJ/T 3328.8-2016 Electronic Products - High Purity Quartz Sand - Part 8: Determination of Aluminum SJ/T 3328.10-2016 Electronic Products - High Purity Quartz Sand - Part 10: Determination of Lead

Replace the following standards

SJ 3228.1-1989 Specification for high purty arenaceous quartz for use in electronic industry

Related Standards

GB/T 2413-1981 Active

GB/T 2413-1981 Piezoelectric ceramic materials—Measuring methods for determination of volume density

Publish Date: 1980-12-31

GB/T 3389.4-1982 Replaced

GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod

Publish Date: 1982-12-30

GB/T 5594.1-1985 Active

GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness

Publish Date: 1985-11-27

GB/T 5594.2-1985 Active

GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio

Publish Date: 1985-11-27

GB/T 5594.3-1985 Replaced

GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion

Publish Date: 1985-11-27

GB/T 5594.4-1985 Replaced

GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value

Publish Date: 1985-11-27