GB/T 23414-2026 Pending National standards

GB/T 23414-2026 Microbeam analysis—Scanning electron microscopy—Vocabulary

Publish Date: 2026-01-28 Implement Date: 2026-08-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 23414-2026

Standard Type: National standards

Standard Status: Pending

is_force_gb: no

CCS Name: Electronic optics and other physical optical instruments

ICS Name: Imaging technology (vocabulary)

Publish Date: 2026-01-28

Implement Date: 2026-08-01

Pages: 36 pages

Scope

This document defines the terms used in the practical application of scanning electron microscopy (SEM). It includes basic terms and terms classified by different technical content, as well as terms already defined in ISO 23833.
This document is applicable to all standardization documents related to the practical application of SEM. Additionally, some of the terms in this document are also applicable to documents in related fields [such as electron probe microanalysis (EPMA), analytical electron microscopy (AEM), energy dispersive X-ray spectrometry (EDX), etc.].