GB/T 23414-2009 Active National standards

GB/T 23414-2009 Microbeam analysis—Scanning electron microscopy—Vocabulary

Publish Date: 2009-04-01 Implement Date: 2009-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 23414-2009

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic optics and other physical optical instruments

ICS Name: Imaging technology (vocabulary)

Publish Date: 2009-04-01

Implement Date: 2009-12-01

Pages: 31 pages

Scope

This standard defines the terms used in scanning electron microscopy (SEM) practice. It includes general terms and terms for specific concepts classified by technology, as well as terms already defined in ISO 23833.
This standard applies to all standardized documents related to SEM practice. In addition, some of the term definitions in this standard also apply to documents in related fields [for example: electron probe microanalysis (EPMA), analytical electron microscopy (AEM), energy dispersive X-ray spectrometry (EDX), etc.].