T/CAIA YQ007-2021 Electron multiplication charge-coupled device optical performance universal testing method
T/CAIA YQ007-2021 Electron multiplication charge-coupled device optical performance universal testing method
Basic Information
Scope
Scope: This standard specifies the terminology and parameter testing methods for electron-multiplied charge-coupled imaging devices (hereinafter referred to as electron-multiplied CCD devices) with a spectral range of 140nm to 1100nm. This standard applies to the parameter testing of electron-multiplied charge-coupled imaging devices with a spectral range of 140nm to 1100nm. Main technical content: The detailed requirements for each performance test are described in the following test methods of this standard. The test methods specified in this standard are classified as follows: — Method 01: Full-well capacity test of the multiplier register; — Method 02: Gain test; — Method 03: Equivalent readout noise test; — Method 04: Noise factor test; — Method 05: Dark signal test; — Method 06: Dark signal non-uniformity test; — Method 07: Photoresponse non-linearity test; — Method 08: Signal-to-noise ratio test; — Method 09: Defect test; — Method 10: Spectral response range test