T/ZGIA 007-2023 Active Group standards

T/ZGIA 007-2023 Determination of Breaking Strength of Graphene Thin Films by Atomic Force Microscopy (AFM)

T/ZGIA 007-2023 Determination of Breaking Strength of Graphene Thin Films by Atomic Force Microscopy (AFM)

Publish Date: 2023-12-19 Implement Date: 2023-12-20 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/ZGIA 007-2023
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: -
ICS Name: Integrated Metrology and Measurement
Publish Date: 2023-12-19
Implement Date: 2023-12-20

Scope

Main technical content: This standard specifies the atomic force microscopy method for measuring the breaking strength of graphene films. This standard is applicable to graphene films that are suspended and fixed on a silicon substrate with a size larger than the probe's radius of curvature and the diameter of the silicon substrate's holes. Other suspended two-dimensional materials can be implemented with reference to this standard.

Development Information

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