GB/T 42659-2023 Surface chemical analysis—Scanning probe microscopy—Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 42659-2023 Surface chemical analysis—Scanning probe microscopy—Determination of geometric quantities using SPM:Calibration of measuring systems
Basic Information
Scope
This document describes the characterization and calibration methods for the scanning axis of scanning probe microscopes (SPMs) used for the highest-level geometric measurements, which are suitable for providing further calibration for measurement systems, but not for general industrial applications with lower calibration requirements.
The purpose of this document is to:
—— Improve the comparability of SPM geometric measurement results by tracing back to length units;
—— Specify the minimum requirements for calibration procedures and acceptance conditions;
—— Confirm the capability of the calibrated instrument (assign the instrument to a category with "calibration capability");
—— Specify the scope of calibration (measurement and environmental conditions, measurement range, time stability, and versatility);
—— Provide a model for calculating the uncertainty of simple geometric quantities in SPM measurements according to ISO/IEC Guide 98-3;
—— Specify the requirements for reporting results.