GB/T 42676-2023 Active National standards

GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal—X-ray diffraction method

Publish Date: 2023-08-06 Implement Date: 2024-03-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 42676-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: \nMetal material testing

Publish Date: 2023-08-06

Implement Date: 2024-03-01

Pages: 8 pages

Scope

This document describes a method of using an X-ray diffractometer to test the half-peak width of the twin crystal swing curve of semiconductor materials, and then evaluating the quality of semiconductor single-crystal crystals. This document is suitable for testing the quality of crystals of single-crystal materials such as silicon carbide, diamond, and gallium oxide. The quality of crystals of semiconductor materials such as silicon, gallium arsenide, and indium phosphide can also be tested by referring to this document.