GB/T 2971-1982
Abolished
GB/T 30653-2014
Active
National standards
GB/T 30653-2014 Test method for crystal quality of Ⅲ-nitride epitaxial layers
GB/T 30653-2014 Test method for crystal quality of Ⅲ-nitride epitaxial layers
Basic Information
Standard Code:
GB/T 30653-2014
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nTest methods for the physical properties of metals
ICS Name:
Nondestructive testing of metal materials
Publish Date:
2014-12-31
Implement Date:
2015-09-01
Pages:
7 pages
Scope
This standard specifies the method for testing the crystallinity of epitaxial nitride films of Group III nitrides using high-resolution X-ray diffractometers.
This standard is applicable to the testing of the crystallinity of nitride (Ga, In, Al)N monolayer or multilayer heteroepitaxial films grown on oxide substrates (Al2O3, ZnO, etc.) or semiconductor substrates (GaN, Si, GaAs, SiC, etc.). The testing of the crystallinity of other heteroepitaxial films can also refer to this standard.
Development Information
Related Standards
GB/T 5193-1985
Replaced
GB/T 5193-1985 Method of ultrasonic inspection for wrought titanium and titanium alloys products
GB/T 5616-1985
Replaced
GB/T 5616-1985 Guidlines for application of conventional nondestructive testing methods
GB/T 5677-1985
Replaced
GB/T 5677-1985 Methods of radiographic testing and classification of radiographs for steel castings
GB/T 5778-1986
abolished_transferred
GB/T 5778-1986 Determination of hermeticity of expansion alloys
GB/T 7233-1987
Replaced