GB/T 4855-1984
Abolished
GB/T 42969-2023
Active
National standards
GB/T 42969-2023 Displacement damage test method for components
GB/T 42969-2023 Displacement damage test method for components
Price:
$ 50
Basic Information
Standard Code:
GB/T 42969-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-09-07
Implement Date:
2024-01-01
Pages:
9 pages
Scope
This document describes the test method for displacement damage of components. This document is applicable to optoelectronic integrated circuits and discrete devices, such as charge-coupled devices (CCDs), optoelectronic couplers, image sensors (APSs), photosensitive tubes, etc., for which displacement damage irradiation tests are conducted using protons and neutrons. Displacement damage irradiation tests for other components can be carried out with reference to this document.
Development Information
Referenced Standards
GB/T 19022-2003 Measurement management systems—Requirements for measurement processes and measuring equipment
GB/T 27418-2017 Guide to the evaluation and expression of uncertainty in measurement
GB 18871-2002 Basic standards for protection against ionizing radiation and for the safety of radiation sources
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished