GB/T 45773-2025 Surface chemical analysis—Near real-time information from the X-ray photoelectron spectroscopy survey scan—Rules for identification of,and correction for,surface contamination by carbon-containing compounds
GB/T 45773-2025 Surface chemical analysis—Near real-time information from the X-ray photoelectron spectroscopy survey scan—Rules for identification of,and correction for,surface contamination by carbon-containing compounds
Basic Information
Scope
This document describes a method for assisting in the surface analysis of material films that do not contain carbon compounds as expected components, but C 1s peaks are observed in the full scan spectra. These films can be generated on metals and alloys by oxidation or electrochemical oxidation, or deposited on inert substrates. The described procedure is not applicable to discontinuous deposition of particles on the substrate. In addition, a simple procedure is provided for identifying C 1s signals from carbon-containing surface contaminants. When the C 1s peak is determined to come from an external coating layer, the composition derived from the full spectrum can be corrected for its influence. The recommended procedures are provided in the form of simple rule structures in an "if-then" format, with the aim of enabling the information they contain to be utilized by automated programs in data systems. The provided rules only use information retrieved from XPS full scan (spectra).