GB/T 4855-1984
Abolished
GB/T 43035-2023
Active
National standards
GB/T 43035-2023 Semiconductor devices—Integrated circuits—Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits—Section 1:Requirements for internal visual examination
GB/T 43035-2023 Semiconductor devices—Integrated circuits—Part 20:Generic specification for film integrated circuits and hybrid film integrated circuits—Section 1:Requirements for internal visual examination
Basic Information
Standard Code:
GB/T 43035-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nMembrane integrated circuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2023-09-07
Implement Date:
2023-09-07
Pages:
23 pages
Scope
The purpose of this document is to inspect the materials, structures, and manufacturing processes inside film integrated circuits and hybrid film integrated circuits (FICs and HFICs, referred to as devices hereinafter). This inspection is typically conducted before capping or encapsulation to identify and eliminate devices with internal defects. Such defects can cause the devices to fail during normal use. Other acceptance criteria should be agreed upon with the purchaser or supplier.
Development Information
Adopt standards
IEC 60748-20-1:1994
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished