GB/T 43087-2023 Active National standards

GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials

Publish Date: 2023-09-07 Implement Date: 2024-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 43087-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic optics and other physical optical instruments

ICS Name: Physicochemical analysis methods

Publish Date: 2023-09-07

Implement Date: 2024-04-01

Pages: 42 pages

Scope

This document specifies a method for determining the average interface position between two different materials recorded in cross-sectional images of layered materials. This document is applicable to cross-sectional images of layered materials recorded by transmission electron microscopes (TEMs) or scanning transmission electron microscopes (STEMS), and cross-sectional elemental distribution maps recorded by X-ray energy dispersive spectrometers (EDSs) or electron energy loss spectrometers (EELSs). It is also applicable to digital images captured by digital cameras, computer memories, and imaging plate image sensors, as well as digital images converted from film records by scanners. This document is not applicable to determining the interface position obtained by the multi-layer simulation method (MSS).