GB/T 7581-1987
Active
T/CIE 115-2021
Active
Group standards
T/CIE 115-2021 General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components
T/CIE 115-2021 General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components
Price:
$ 30.00
Basic Information
Standard Code:
T/CIE 115-2021
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Basic standards and general methods
ICS Name:
Semiconductor discrete devices
Publish Date:
2021-11-22
Implement Date:
2022-02-01
Pages:
20 pages
Scope
This document establishes a common method and procedure for analyzing the failure mechanisms, modes, and impacts (FMMEA) of electronic components.
This document is applicable to the risk level analysis of electronic components.
Development Information
Referenced Standards
GB/T 2900.99-2016 Electrotechnical terminology—Dependability
GB/T 7826-1987 Analysis techniques for system reliability—Procedure for failure mode and effects analysis(FMEA)
GB/T 7826-2012 Analysis techniques for system reliability—Procedure for failure mode and effects analysis(FMEA)
GJB 451
GJB/Z 1391
Related Standards
GB/T 4586-1994
Active
GB/T 4586-1994 Semiconductor devices Discrete devices—Part 8:Field-effect transistors
GB/T 4587-1994
Replaced
GB/T 4587-1994 Semiconductor discrete devices and integrated circuits—Part 7:Bipolar transistors
GB/T 4937-1995
Replaced
GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
GB/T 9313-1995
Active
GB/T 9313-1995 General specifications for CRT display device of computer
GB/T 8446.1-2004
Replaced