GB/T 14264-1993
Replaced
T/CIE 121-2021
Active
Group standards
T/CIE 121-2021 Technical method for thermal resistance test of reverse conducting IGBT(RC-IGBT)
T/CIE 121-2021 Technical method for thermal resistance test of reverse conducting IGBT(RC-IGBT)
Price:
$ 22.00
Basic Information
Standard Code:
T/CIE 121-2021
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor discrete devices
ICS Name:
Integrated Components of Semiconductor Devices
Publish Date:
2021-11-22
Implement Date:
2022-02-01
Pages:
16 pages
Scope
This document describes the basic principles and methods of electrical testing for the steady-state thermal resistance and transient thermal resistance of reverse-conducting insulated-gate bipolar transistor (IGBT) devices (hereinafter referred to as "devices").
This document is applicable to the thermal resistance testing of reverse-conducting IGBT devices.
Development Information
Referenced Standards
Related Standards
GB/T 14844-1993
Replaced
GB/T 14844-1993 Designations of semiconductor materials
GB/T 17573-1998
Active
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
GB/T 12560-1999
Active
GB/T 12560-1999 Semiconductor devices Sectional specification for discrete devices
GB/T 11499-2001
Active
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
GB/T 20521-2006
Active