LY/T 1662.1-2008
Active
GB/T 43226-2023
Active
National standards
GB/T 43226-2023 Time-domain test methods for space single event soft errors of semiconductor integrated circuit
GB/T 43226-2023 Time-domain test methods for space single event soft errors of semiconductor integrated circuit
Basic Information
Standard Code:
GB/T 43226-2023
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic components
ICS Name:
Aerospace systems and operating devices
Publish Date:
2023-09-07
Implement Date:
2024-01-01
Pages:
8 pages
Scope
This document specifies the principles, environmental conditions, instrumentation, test samples, test procedures, and test reports for the time-domain testing of single-particle soft errors in aerospace-grade semiconductor integrated circuits. This document is applicable to the testing of single-particle soft errors in aerospace-grade semiconductor integrated circuits.
Development Information
Referenced Standards
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