T/SLDA 017-2024 Active Group standards

T/SLDA 017-2024 Mini&Micro LED display Mura defect evaluation method

T/SLDA 017-2024 Mini&Micro LED display Mura defect evaluation method

Publish Date: 2024-12-31 Implement Date: 2024-12-31 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/SLDA 017-2024
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: Electronic components and information technology
ICS Name: Electronic display devices
Publish Date: 2024-12-31
Implement Date: 2024-12-31

Scope

Scope: This document specifies the general requirements for Mura defect testing, brightness Mura defect evaluation, and chromaticity Mura defect evaluation of Mini/Micro LED displays. This document applies to indoor and outdoor Mini/Micro LED displays whose sub-pixels are composed of LED chips with a longest side less than 300 μm, and whose sub-pixels and pixels are arranged in a rectangular pattern. For other arrangements of indoor and outdoor Mini/Micro LED displays, please refer to the implementation guidelines for reference. Main technical content: This standard specifies the general requirements for Mura defect testing, brightness Mura defect evaluation, and chromaticity Mura defect evaluation of Mini/Micro LED displays. This standard provides the testing equipment, power supply, stability conditions, tested area, measurement angle, and measurement distance required for testing Mura defects in Mini/Micro LED displays. This standard proposes a method for evaluating brightness Mura defects, including calculation formulas for each pixel's brightness contrast ratio (Cp_i), the minimum perceptible difference contrast ratio (C_jndi), the brightness Mura index LMU_i, and the brightness Mura defect index LMU of the tested area. This standard also proposes a method for evaluating chromaticity Mura defects, including calculation formulas for the main wavelength difference ?λ_Dpi and the chromaticity Mura defect index CMU of the tested area in the testing process.

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