T/COEMA 001L-2022 blue-emitting semiconductor laser

Scope

Main Technical Content: Preface 1 Scope 2 Normative Reference Documents 3 Terms and Definitions 4 Model and Parameter Testing 4.1 Model Naming 4.2 Main Parameters 4.3 Test Requirements 5 Laser Electrical and Laser Power Testing 5.1 Test Device 5.2 Test Steps 5.3 Data Processing 6 Laser Wavelength Testing 6.1 Test Device 6.2 Test Steps 6.3 Data Processing 7 Laser Beam Profile Testing 7.1 Test Device 7.2 Test Steps 7.3 Data Processing 8 Mode Measurement Reference Methods and Standards 9 Laser Technical Requirements 9.1 Appearance Quality Requirements 9.2 Work Environment Adaptability Requirements 9.3 Storage Environment Requirements 9.4 Power Supply Requirements 9. Reliability 9.6 Laser Operating Noise 10 Test Methods and Test Requirements 10.1 Test Methods 10.2 Protection Requirements During Testing 11 Inspection Rules 11.1 Inspection Classification 11.2 Inspection Items 11.3 Factory Inspection 11.4 Type Inspection 12 Laser Shipping Requirements 12.1 Markings 12.2 Packaging 12.3 Transportation 12.4 Storage Figure 1: Fast-Axis Divergence Angle Schematic Figure 2: Slow-Axis Divergence Angle Schematic Figure 3: Framework Diagram of Laser Electrical and Laser Power Testing Device Figure 4: Calculation Method for Determining Threshold Current Figure 5: Calculation Method for Slope Efficiency Figure 6: Framework Diagram of Repetition Frequency and Pulse Width Testing Device Figure 7: Oscilloscope-Recorded Light Pulse Waveform Figure 8: Framework Diagram of Laser Wavelength Testing Device Figure 9: Center Wavelength Curve Schematic Figure 10: Spectral Width Schematic Figure 11: Framework Diagram of Laser Beam Profile Testing Device Figure 12: Framework Diagram of Polarization Testing Device Figure 13: Framework Diagram of Laser Mode Measurement Device Figure 14: Near-Field Mode Structure of a Laser Section (at 20% Maximum Current) Figure 15: Mode Structure of a L

Development Information

Related Standards