The test method for thermal resistance of light-emitting diodes specified in T/CSA 047-2019
T/CSA 047-2019
Basic Information
Scope
Scope: This standard specifies an electrical method for thermal resistance testing of light-emitting diodes (LEDs) or LED arrays. This standard applies to LEDs powered by direct current and under the condition of no self-heating. The forward voltage of the tested LEDs should exhibit a clear linear relationship with the ambient temperature. This standard is suitable for testing the thermal resistance and junction temperature of LEDs in steady-state and transient conditions in laboratory environments and small batches of single LEDs and LED arrays of certain structures (including series, parallel, and mixed connections of LEDs). This standard is not applicable to the thermal resistance and junction temperature testing of laser diodes. Main technical contents: This standard specifies an electrical method for thermal resistance testing of light-emitting diodes (LEDs) or LED arrays. This standard applies to LEDs powered by direct current and under the condition of no self-heating. The forward voltage of the tested LEDs should exhibit a clear linear relationship with the ambient temperature. This standard is suitable for testing the thermal resistance and junction temperature of LEDs in steady-state and transient conditions in laboratory environments and small batches of single LEDs and LED arrays of certain structures (including series, parallel, and mixed connections of LEDs). This standard is not applicable to the thermal resistance and junction temperature testing of laser diodes.