T/CSTM 00988-2023 Test method for low-loss ceramic substrate materials used in RF circuits
T/CSTM 00988-2023 Test method for low-loss ceramic substrate materials used in RF circuits
Basic Information
Scope
Scope: This document specifies the test methods for the thickness, electrical performance, thermal performance, mechanical performance, physical performance, processability, process adaptability, and environmental reliability of low-loss ceramic substrate materials for radio frequency (300kHz~300GHz) circuits. This document is applicable to the performance testing of low-loss ceramic substrate materials at the material level and the component-level verification after processing into ceramic printed circuit boards. Main technical content: This document specifies the test methods for the thickness, electrical performance, thermal performance, mechanical performance, physical performance, processability, process adaptability, and environmental reliability of low-loss ceramic substrate materials for radio frequency (300kHz~300GHz) circuits. This document is applicable to the performance testing of low-loss ceramic substrate materials at the material level and the component-level verification after processing into ceramic printed circuit boards.